Deep Learning for In Situ and Real-Time Quality Monitoring in Additive Manufacturing Using Acoustic Emission. - Sergey A. Shevchik; Giulio Masinelli; Christoph Kenel; Christian Leinenbach; Kilian Wasmer (IEEE Trans. Ind. Informatics, 2019)

Extended Analysis of Power Cycling Behavior of TO-Packaged SiC Power MOSFETs. - Ivana Kovacevic-Badstuebner; Salvatore Race; Ulrike Grossner; Elena Mengotti; Christoph Kenel; Enea Bianda; Joni P. A. Jormanainen (IRPS, 2023)