Electro-thermal short pulsed simulation for SOI technology. - Christophe Entringer; Philippe Flatresse; Philippe Galy; Florence Azaïs; Pascal Nouet (Microelectron. Reliab., 2006)

Impact and damage on deep sub-micron CMOS technology induced by substrate current due to ESD stress. - Philippe Galy; Sylvain Dudit; Michel Vallet; Corinne Richier; Christophe Entringer; Frank Jezequel; E. Petit; J. Beltritti (Microelectron. Reliab., 2009)

Evaluation of the ESD performance of local protections based on SCR or bi-SCR with dynamic or static trigger circuit in 32 nm. - J. Bourgeat; Christophe Entringer; Philippe Galy; Marise Bafleur; D. Marin-Cudraz (Microelectron. Reliab., 2010)