Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. - Nicolas Rodriguez 001; Jérôme Adrian; Catherine Grosjean; Gérald Haller; Christophe Girardeaux; Alain Portavoce (Microelectron. Reliab., 2006)

Investigation of a new method for dopant characterization. - Jérôme Adrian; Nicolas Rodriguez 001; Fabien Essely; Gérald Haller; Catherine Grosjean; Alain Portavoce; Christophe Girardeaux (Microelectron. Reliab., 2007)