Dynamic Flash Memory Operation Experimentally Validated with 65nm SOI Technology. - Koji Sakui; Daniele Garbin; Yoshihisa Iwata; Gautam Gaddemane; Yisuo Li; Yiqun Wan; Ken'ichi Kanazawa; Eyup Can Demir; Iwao Kunishima; Andrea Fantini; Masakazu Kakumu; Christophe Lorant; et al. (IMW, 2025)