Neutron radiation test of graphic processing units. - Paolo Rech; Caroline Aguiar; Ronaldo Rodrigues Ferreira; Christopher Frost 002; Luigi Carro (IOLTS, 2012)

Temperature dependence of neutron-induced soft errors in SRAMs. - Marta Bagatin; Simone Gerardin; Alessandro Paccagnella; Carla Andreani; Giuseppe Gorini; Christopher D. Frost (Microelectron. Reliab., 2012)

Experimental evaluation of thread distribution effects on multiple output errors in GPUs. - Paolo Rech; Caroline Aguiar; Christopher Frost 002; Luigi Carro (ETS, 2013)

Neutron sensitivity of integer and floating point operations executed in GPUs. - Paolo Rech; Caroline Aguiar; Christopher Frost 002; Luigi Carro (LATW, 2013)

Decreasing FIT with diverse triple modular redundancy in SRAM-based FPGAs. - Lucas A. Tambara; Fernanda Lima Kastensmidt; Paolo Rech; Christopher Frost 002 (DFT, 2014)

Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs. - Fernanda Lima Kastensmidt; Jorge L. Tonfat; Thiago Hanna Both; Paolo Rech; Gilson I. Wirth; Ricardo Reis 001; Florent Bruguier; Pascal Benoit; Lionel Torres; Christopher Frost 002 (ETS, 2014)

GPUs Neutron Sensitivity Dependence on Data Type. - Paolo Rech; Christopher Frost 002; Luigi Carro (J. Electron. Test., 2014)

Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs. - Fernanda Lima Kastensmidt; Jorge L. Tonfat; Thiago Hanna Both; Paolo Rech; Gilson I. Wirth; Ricardo Reis 001; Florent Bruguier; Pascal Benoit; Lionel Torres; Christopher Frost 002 (Microelectron. Reliab., 2014)

Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects. - Lucas A. Tambara; Felipe Almeida; Paolo Rech; Fernanda Lima Kastensmidt; Giovanni Bruni; Christopher Frost 002 (ARC, 2015)

An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices. - Daniel Oliveira 002; Sean Blanchard; Nathan DeBardeleben; Fermando Santos; Gabriel Piscoya Dávila; Philippe Olivier Alexandre Navaux; Stephen Wender; Carlo Cazzaniga; Christopher Frost 002; Robert C. Baumann; Paolo Rech (DSN (Supplements), 2020)

Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications. - Daniel Oliveira 002; Sean Blanchard; Nathan DeBardeleben; Fernando Fernandes dos Santos; Gabriel Piscoya Dávila; Philippe O. A. Navaux; Carlo Cazzaniga; Christopher Frost 002; Robert C. Baumann; Paolo Rech (ETS, 2020)

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. - Lyuan Xu; Jingchen Cao; John Brockman; Carlo Cazzaniga; Christopher Frost 002; Shi-Jie Wen; Rita Fung; Bharat L. Bhuva (IRPS, 2020)

Experimental Findings on the Sources of Detected Unrecoverable Errors in GPUs. - Fernando Fernandes dos Santos; Sujit Malde; Carlo Cazzaniga; Christopher Frost 002; Luigi Carro; Paolo Rech (CoRR, 2021)

First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics. - Carlo Cazzaniga; Marta Bagatin; Simone Gerardin; Alessandra Costantino; Christopher D. Frost (IEEE Trans. Emerg. Top. Comput., 2021)

Thermal neutrons: a possible threat for supercomputer reliability. - Daniel Oliveira 002; Sean Blanchard; Nathan DeBardeleben; Fernando Fernandes dos Santos; Gabriel Piscoya Dávila; Philippe O. A. Navaux; Andrea Favalli; Opale Schappert; Stephen Wender; Carlo Cazzaniga; Christopher Frost 002; Paolo Rech (J. Supercomput., 2021)

Irradiation Tests for Commercial Off-the Shelf Components with Atmospheric-like Neutrons and Heavy-Ions. - Paolo Branchini; Andrea Fabbri; Sacha Cormenier; Marco Bernardini; Giovanni Romanelli; Enrico Preziosi; Roberto Senesi; Carla Andreani; Chris Frost 002; Carlo Cazzaniga; Toni Fabio Catalano; Mario Buffardo (CoRR, 2023)

Single Event Effects Assessment of UltraScale+ MPSoC Systems Under Atmospheric Radiation. - Dimitris Agiakatsikas; Nikos Foutris; Aitzan Sari; Vasileios Vlagkoulis; Ioanna Souvatzoglou; Mihalis Psarakis; Ruiqi Ye; John Goodacre; Mikel Luján; Maria Kastriotou; Carlo Cazzaniga; Chris Frost 002 (IEEE Trans. Reliab., 2024)

On the Vulnerability of UMOSFETs in Terrestrial Radiation Environments. - Saulo G. Alberton; Alexis C. Vilas Bôas; Jeffery Wyss; Vitor A. P. Aguiar; Matheus S. Pereira; Luca Silvestrin; Serena Mattiazzo; Alessandro Paccagnella; Carlo Cazzaniga; Maria Kastriotou; Christopher D. Frost; Nilberto H. Medina (IEEE Access, 2025)