Visualization and Interpretation of High Content Screening Data. - Andrew Smellie; Christopher J. Wilson; Shi Chung Ng (J. Chem. Inf. Model., 2006)

Influence of test structure design on stress-induced-voiding using an experimentally validated Finite Element Modeling approach. - Melina Lofrano; Kris Croes; Ingrid De Wolf; Christopher J. Wilson (Microelectron. Reliab., 2011)

The Use of Virtual Reality in Psychology: A Case Study in Visual Perception. - Christopher J. Wilson; Alessandro Soranzo (Comput. Math. Methods Medicine, 2015)

Microstructure simulation of grain growth in Cu through silicon vias using phase-field modeling. - Nabi Nabiollahi; Nele Moelans; Mario Gonzalez; Joke De Messemaeker; Christopher J. Wilson; Kristof Croes; Eric Beyne; Ingrid De Wolf (Microelectron. Reliab., 2015)

Dielectric Reliability Study of 21 nm Pitch Interconnects with Barrierless Ru Fill. - Alicja Lesniewska; Philippe J. Roussel; Davide Tierno; Victor Vega-Gonzalez; Marleen H. van der Veen; Patrick Verdonck; Nicolas Jourdan 002; Christopher J. Wilson; Zsolt Tökei; Kris Croes (IRPS, 2020)

Metal reliability mechanisms in Ruthenium interconnects. - Olalla Varela Pedreira; Michele Stucchi; Anshul Gupta; Victor Vega-Gonzalez; Marleen van der Veen; Stephane Lariviere; Christopher J. Wilson; Zsolt Tökei; Kristof Croes (IRPS, 2020)

Risk as affect: The affect heuristic in cybersecurity. - Paul van Schaik; Karen Renaud; Christopher J. Wilson; Jurjen Jansen; Joseph A. Onibokun (Comput. Secur., 2020)