The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. - Christopher L. Henderson; Jerry M. Soden; Charles F. Hawkins (ITC, 1991)

Economic Impact of Type I Test Errors at System and Board Levels. - Christopher L. Henderson; Richard H. Williams; Charles F. Hawkins (ITC, 1992)

IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. - Jerry M. Soden; Richard E. Anderson 002; Christopher L. Henderson (ITC, 1996)

Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. - Edward I. Cole Jr.; Jerry M. Soden; Paiboon Tangyunyong; Patrick L. Candelaria; Richard W. Beegle; Daniel L. Barton; Christopher L. Henderson; Charles F. Hawkins (ITC, 1997)

Signature Analysis for IC Diagnosis and Failure Analysis. - Christopher L. Henderson; Jerry M. Soden (ITC, 1997)

IC Diagnosis: Industry Issues. - Jerry M. Soden; Christopher L. Henderson (ITC, 1997)

IC Failure Analysis: Magic, Mystery, and Science. - Jerry M. Soden; Richard E. Anderson 002; Christopher L. Henderson (IEEE Des. Test Comput., 1997)

Still in the Stone Age? - Jerry M. Soden; Christopher L. Henderson (IEEE Des. Test Comput., 1997)

Failure analysis techniques for a 3D world. - Christopher L. Henderson (Microelectron. Reliab., 2013)