A Compute-in-Memory Architecture Compatible with 3D NAND Flash that Parallelly Activates Multi-Layers. - Liang Zhao; Chu Yan; Fan Yang; Shifan Gao; Gabriel Rosca; Dan Manea; Zhichao Lu; Yi Zhao 015 (DAC, 2021)

Universal Hot Carrier Degradation Model under DC and AC Stresses. - Chu Yan; Yaru Ding; Yiming Qu; Liang Zhao; Yi Zhao 015 (IRPS, 2022)

Interval time dependent wake-up effect of HfZrO ferroelectric capacitor. - Yaru Ding; Xinwei Yu; Chu Yan; Zeping Weng; Yiming Qu; Yi Zhao 015 (IRPS, 2023)

GHz Cycle-to-Cycle Variation in Ultra-scaled FinFETs: From the Time-Zero to the Aging States. - Yiming Qu; Chu Yan; Xinwei Yu; Yaru Ding; Yi Zhao 015 (IRPS, 2023)

GHz AC to DC TDDB Modeling with Defect Accumulation Efficiency Model. - Xinwei Yu; Chu Yan; Yaru Ding; Yiming Qu; Yi Zhao 015 (IRPS, 2023)

Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs. - Yiming Qu; Chu Yan; Yaru Ding; Yi Zhao 015 (IRPS, 2024)

Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced FinFETs. - Chu Yan; Yaru Ding; Yiming Qu; Yi Zhao 015 (IRPS, 2024)