Low-Complexity Algorithmic Test Generation for Neuromorphic Chips. - Hsu-Yu Huang; Chu-Yun Hsiao; Tsung-Te Liu; James Chien-Mo Li (DAC, 2024)

Test Compression for Neuromorphic Chips. - Xin-Ping Chen; Hsu-Yu Huang; Chu-Yun Hsiao; Jennifer Shueh-Inn Hu; James Chien-Mo Li (ETS, 2024)