Investigation on the immunity of microcontroller to electrical fast transients. - Chuangwei Li; Jiancheng Li; Jianfei Wu; Yu Xiao (ASICON, 2015)

Microcontroller susceptibility variations to EFT burst during accelerated aging. - Jianfei Wu; Chuangwei Li; Binhong Li; Wei Zhu; Hongyi Wang 003 (Microelectron. Reliab., 2016)