Consistency in wafer based outlier screening. - Sebastian Siatkowski; Chuanhe Jay Shan; Li-C. Wang; Nikolas Sumikawa; W. Robert Daasch; John M. Carulli (VTS, 2016)

Systematic defect detection methodology for volume diagnosis: A data mining perspective. - Chuanhe Jay Shan; Pietro Babighian; Yan Pan; John M. Carulli; Li-C. Wang (ITC, 2017)

Some considerations on choosing an outlier method for automotive product lines. - Li-C. Wang; Sebastian Siatkowski; Chuanhe Jay Shan; Matthew Nero; Nikolas Sumikawa; LeRoy Winemberg (ITC, 2017)

Concept Recognition in Production Yield Data Analytics. - Matthew Nero; Chuanhe Jay Shan; Li-C. Wang; Nik Sumikawa (ITC, 2018)

Discovering Interesting Plots in Production Yield Data Analytics. - Matthew Nero; Chuanhe Jay Shan; Li-C. Wang; Nik Sumikawa (CoRR, 2018)

Facilitating Deployment Of A Wafer-Based Analytic Software Using Tensor Methods: Invited Paper. - Li-C. Wang; Chuanhe Jay Shan; Ahmed Wahba (ICCAD, 2019)

Wafer Plot Classification Using Neural Networks and Tensor Methods. - Ahmed Wahba; Chuanhe Jay Shan; Li-C. Wang; Nik Sumikawa (ITC-Asia, 2019)

Deploying A Machine Learning Solution As A Surrogate. - Chuanhe Jay Shan; Ahmed Wahba; Li-C. Wang; Nik Sumikawa (ITC, 2019)

Primitive Concept Identification In A Given Set Of Wafer Maps. - Ahmed Wahba; Chuanhe Jay Shan; Li-C. Wang; Nik Sumikawa (VLSI-DAT, 2019)

Learning A Wafer Feature With One Training Sample. - Yueling Jenny Zeng; Li-C. Wang; Chuanhe Jay Shan; Nik Sumikawa (ITC, 2020)

MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification. - Yueling Jenny Zeng; Li-C. Wang; Chuanhe Jay Shan (ITC, 2021)