Full reliability characterization of three-terminal SOT-MTJ devices and corresponding arrays. - Xinyi Xu; Hongchao Zhang; Chuanpeng Jiang; Jinhao Li 007; Shiyang Lu; Yunpeng Li; Honglei Du; Xueying Zhang; Zhaohao Wang; Kaihua Cao; Weisheng Zhao; Shuqin Lyu; et al. (IRPS, 2023)