A Maximal Frequent Itemset Algorithm. - Hui Wang; Qinghua Li; Chuanxiang Ma; Kenli Li 001 (RSFDGrC, 2003)

Parallel Algorithm for Mining Frequent Closed Sequences. - Chuanxiang Ma; Qinghua Li (AIS-ADM, 2005)

A Novel Relational Database Watermarking Algorithm. - Yu Fu; Cong Jin; Chuanxiang Ma (PAISI, 2007)

A MapReduce Reinforced Distributed Sequential Pattern Mining Algorithm. - Xiao Yu 008; Jin Liu 016; Xiao Liu 004; Chuanxiang Ma; Bin Li 027 (ICA3PP (2), 2015)

A Multi-Source TrAdaBoost Approach for Cross-Company Defect Prediction. - Xiao Yu 008; Jin Liu 016; Mandi Fu; Chuanxiang Ma; Guoping Nie (SEKE, 2016)

A reinforced collaborative filtering approach based on similarity propagation and score predication graph. - Xiaofei Yin; Tianye Chen; Wenrui Liu 001; Rong Xiao; Chuanxiang Ma; Zhongwang Fu (EURASIP J. Wirel. Commun. Netw., 2016)

A Multi-Source Approach for Bug Triage. - Jin Liu 016; Yiqiuzi Tian; Xiao Yu 008; Zijiang Yang 006; Xiangyang Jia; Chuanxiang Ma; Zheng Xu 001 (Int. J. Softw. Eng. Knowl. Eng., 2016)

FSCR: A Feature Selection Method for Software Defect Prediction. - Xiao Yu; Ziyi Ma; Chuanxiang Ma; Yi Gu; Ruiqi Liu; Yan Zhang (SEKE, 2017)

Cross-company defect prediction via semi-supervised clustering-based data filtering and MSTrA-based transfer learning. - Xiao Yu 008; Man Wu; Yiheng Jian; Kwabena Ebo Bennin; Mandi Fu; Chuanxiang Ma (Soft Comput., 2018)

DepthBLIP-2: Leveraging Language to Guide BLIP-2 in Understanding Depth Information. - Wei Chen; Changyong Shi; Chuanxiang Ma; Wenhao Li; Shulei Dong (ACCV (7), 2024)

On the relative value of clustering techniques for Unsupervised Effort-Aware Defect Prediction. - Peixin Yang; Lin Zhu; Yanjiao Zhang; Chuanxiang Ma; Liming Liu; Xiao Yu 008; Wenhua Hu (Expert Syst. Appl., 2024)

On the value of imbalance loss functions in enhancing deep learning-based vulnerability detection. - Xiaoxue Ma; Yanzhong He; Jacky Keung; Cheng Tan; Chuanxiang Ma; Wenhua Hu; Fuyang Li (Expert Syst. Appl., 2025)

Bug numbers matter: An empirical study of effort-aware defect prediction using class labels versus bug numbers. - Peixin Yang; Ziyao Zeng; Lin Zhu; Yanjiao Zhang; Xin Wang 114; Chuanxiang Ma; Wenhua Hu (Softw. Pract. Exp., 2025)