Study and Implementation of 600-V High-Voltage Gate Driver IC With the Common-Mode Dual-Interlock Technique for GaN Devices. - Jing Zhu 006; Siyuan Yu; Yangyang Lu; Weifeng Sun; Chuanyi Cheng; Ding Yan; Yunwu Zhang; Shaohong Li; Long Zhang; Sen Zhang; Nailong He; Yan Gu (IEEE Trans. Ind. Electron., 2021)