Voltage stress-induced performance degradation in NMOSFET mixer. - Chuanzhao Yu; Hong Yang; Enjun Xiao; J. S. Yuan (IEICE Electron. Express, 2005)

Hot carrier and soft breakdown effects on LNA performance for ultra wideband communications. - Enjun Xiao; P. P. Ghosh; Chuanzhao Yu; J. S. Yuan (Microelectron. Reliab., 2005)

Voltage stress-induced hot carrier effects on SiGe HBT VCO. - Chuanzhao Yu; Enjun Xiao; J. S. Yuan (Microelectron. Reliab., 2005)

Dynamic stress-induced high-frequency noise degradations in nMOSFETs. - Chuanzhao Yu; J. S. Yuan; Anwar Sadat (Microelectron. Reliab., 2005)

Low-power CMOS wireless MEMS motion sensor for physiological activity monitoring. - Anwar Sadat; Hongwei Qu; Chuanzhao Yu; J. S. Yuan; Huikai Xie (IEEE Trans. Circuits Syst. I Regul. Pap., 2005)

Study of performance degradations in DC-DC converter due to hot carrier stress by simulation. - Chuanzhao Yu; L. Jiang; Jiann-Shiun Yuan (Microelectron. Reliab., 2006)

Dynamic voltage stress effects on nMOS varactor. - Chuanzhao Yu; J. S. Yuan; Enjun Xiao (Microelectron. Reliab., 2006)

PMOS breakdown effects on digital circuits - Modeling and analysis. - Weidong Kuang; Lizhi Cao; Chuanzhao Yu; Jiann-Shiun Yuan (Microelectron. Reliab., 2008)

A multiband multimode transmitter without driver amplifier. - Omid Oliaei; Mark Kirschenmann; David Newman; Kurt Hausmann; Haolu Xie; Patrick Rakers; Mahib Rahman; Michael Gomez; Chuanzhao Yu; Benjamin Gilsdorf; Kurt Sakamoto (ISSCC, 2012)