A simple and effective method for the use of chemical accident cases. - Sifeng Jing; Xiwei Liu; Chuanzhong Xu (SOLI, 2016)

A closed-form trapped-charge-included drain current compact model for amorphous oxide semiconductor thin-film transistors. - Fei Yu; Chuanzhong Xu; Gongyi Huang; Wei Lin; Tsair-Chun Liang (Microelectron. Reliab., 2018)