Reliability of deep learning models for scanning electron microscopy analysis. - Chuen-Wun Pai; Hung-Wei Hsueh; Shu-Han Hsu (Mach. Learn. Sci. Technol., 2025)

Anomaly Detection Reliability in Consumer Electronics Manufacturing. - Chuen-Wun Pai; Hung-Wei Hsueh; Shu-Han Hsu (IEEE Trans. Consumer Electron., 2025)