Defects, Fault Modeling, and Test Development Framework for FeFETs. - Changhao Wang; Sicong Yuan; Hanzhi Xun; Chaobo Li; Mottaqiallah Taouil; Moritz Fieback; Danyang Chen; Xiuyan Li; Lin Wang 111; Riccardo Cantoro; Chujun Yin; Said Hamdioui (ITC, 2024)