Ultra-Thinning of C4 Integrated Circuits for Backside Analysis during First Silicon Debug. - Ted R. Lundquist; E. Delenia; J. Harroun; E. LeRoy; Chun-Cheng Tsao (Microelectron. Reliab., 2001)

Subresolution placement using IR image to CAD database alignment: an algorithm for silicon-side probing. - Madhumita Sengupta; Lokesh Johri; Chun-Cheng Tsao; Mark Thompson; Ted R. Lundquist (Image Processing: Algorithms and Systems, 2002)

Imaging and Material Analysis from Sputter-Induced Light Emission Using Coaxial Ion-Photon Column. - Chun-Cheng Tsao; Bill Thompson 002; Ted R. Lundquist (Microelectron. Reliab., 2002)