Evaluation of the nanoindentation behaviors of SiGe epitaxial layer on Si substrate. - Bo-Ching He; Chun-Hu Cheng; Hua-Chiang Wen; Yi-Shao Lai; Ping-Feng Yang; Meng-Hung Lin; Wen-Fa Wu; Chang-Pin Chou (Microelectron. Reliab., 2010)

Nanotribological properties of ALD-processed bilayer TiO2/ZnO films. - Wun-Kai Wang; Hua-Chiang Wen; Chun-Hu Cheng; Ching-Hua Hung; Wu-Ching Chou; Wei-Hung Yau; Ping-Feng Yang; Yi-Shao Lai (Microelectron. Reliab., 2014)

Impact of nanoscale polarization relaxation on endurance reliability of one-transistor hybrid memory using combined storage mechanisms. - Yu-Chien Chiu; Chun-Yen Chang 002; Hsiao-Hsuan Hsu; Chun-Hu Cheng; Min-Hung Lee (IRPS, 2015)

High speed negative capacitance ferroelectric memory. - Chun-Yen Chang 002; Chia-Chi Fan; Chien Liu; Yu-Chien Chiu; Chun-Hu Cheng (ASICON, 2017)

A high output power and low phase noise GaN HEMT VCO with array of switchable inductors. - Hsuan-Ling Kao; Chih-Sheng Yeh; Hsien-Chin Chiu; Cheng-Lin Cho; Chun-Hu Cheng (Int. J. Circuit Theory Appl., 2017)

Effect of body bias and temperature on low-frequency noise in 40-nm nMOSFETs. - Hsien-Chin Chiu; Min-Li Chou; Chun-Hu Cheng; Hsuan-Ling Kao; Cheng-Lin Cho (Microelectron. Reliab., 2017)

Using nanoindentation to investigate the temperature cycling of Sn-37Pb solders. - Hua-Chiang Wen; Wu-Ching Chou; Po-Chen Lin; Yeau-Ren Jeng; Chien-Chang Chen; Hung-Ming Chen; Don Son Jiang; Chun-Hu Cheng (Microelectron. Reliab., 2017)

Interface engineering of ferroelectric negative capacitance FET for hysteresis-free switch and reliability improvement. - Chia-Chi Fan; Chun-Yuan Tu; Ming-Huei Lin; Chun-Yen Chang 002; Chun-Hu Cheng; Yen-Liang Chen; Guan-Lin Liou; Chien Liu; Wu-Ching Chou; Hsiao-Hsuan Hsu (IRPS, 2018)

Editorial: IEDMS 2016. - Chuan-Hsi Liu; Chun-Hu Cheng; Chin-Pao Cheng; Juin J. Liou (Microelectron. Reliab., 2018)

Influence of Y2O3 Doped HfO2 High-k Films on Electrical Properties of MOS and MIM Devices. - Chih-Feng Yen; Yu-Ya Huang; Shen-Hao Tsao; Shih-Hao Lin; Chun-Hu Cheng (ICKII, 2022)

High-k Metal-Insulator-Metal Capacitors for RF and Mixed-Signal VLSI Circuits: Challenges and Opportunities. - D. Kannadassan; K. Sivasankaran; S. Kumaravel 001; Chun-Hu Cheng; Maryam Shojaei Baghini; P. S. Mallick (Proc. IEEE, 2024)