NASFLOW, a Simulation Tool for Silicon Technology Development. - D. David Forsythe; Atul P. Agarwal; Chune-Sin Yeh; Sheldon Aronowitz; Bhaskar Gadepally (DAC, 1990)

Gate-level aged timing simulation methodology for hot-carrier reliability assurance. - Yoshiyuki Kawakami; Jingkun Fang; Hirokazu Yonezawa; Nobufusa Iwanishi; Lifeng Wu; Alvin I-Hsien Chen; Norio Koike; Ping Chen; Chune-Sin Yeh; Zhihong Liu (ASP-DAC, 2000)

GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design. - Lifeng Wu; Jingkun Fang; Heting Yan; Ping Chen; Alvin I-Hsien Chen; Yoshifumi Okamoto; Chune-Sin Yeh; Zhihong Liu; Nobufusa Iwanishi; Norio Koike; Hirokazu Yonezawa; Yoshiyuki Kawakami (ISQED, 2000)