Repeated Testing Applications for Improving the IC Test Quality to Achieve Zero Defect Product Requirements. - Chung-Huang Yeh; Jwu E. Chen (J. Electron. Test., 2019)

The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing. - Chung-Huang Yeh; Jwu E. Chen (ITC-Asia, 2020)

Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect. - Chung-Huang Yeh; Jwu E. Chen (Sensors, 2022)

Multiple Retest Systems for Screening High-Quality Chips. - Chung-Huang Yeh; Jwu E. Chen (J. Electron. Test., 2023)

Recycling Test Methods to Improve Test Capacity and Increase Chip Shipments. - Chung-Huang Yeh; Jwu E. Chen (IEEE Des. Test, 2023)

Prediction of the Test Yield of Future Integrated Circuits Through the Deductive Estimation Method. - Chung-Huang Yeh; Jwu E. Chen (J. Circuits Syst. Comput., 2023)