Measurement and simulation of interfacial adhesion strength between SiO2 thin film and III-V material. - Tsung-Lin Chou; Shin-Yueh Yang; Chung-Jung Wu; Cheng-Nan Han; Kuo-Ning Chiang (Microelectron. Reliab., 2011)

MalSpot: Multi2 Malicious Network Behavior Patterns Analysis. - Ching-Hao Mao; Chung-Jung Wu; Evangelos E. Papalexakis; Christos Faloutsos; Kuo-Chen Lee; Tien-Cheu Kao (PAKDD (1), 2014)