Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop. - Chung Tah Chua; Hock Guan Ong; Kevin Sanchez; Philippe Perdu; Chee Lip Gan (Microelectron. Reliab., 2016)

Embedded-EEPROM descrambling via laser-based techniques - A case study on AVR MCU. - Samuel Chef; Chung Tah Chua; Jing Yun Tay; Jason Cheah; Chee Lip Gan (FDTC, 2022)

Explainable automated data estimation in Logic State Imaging of embedded SRAM. - Samuel Chef; Chung Tah Chua; Jing Yun Tay; Chee Lip Gan (ISCAS, 2024)