A polynomial algorithm for checking diagnosability of Petri nets. - YuanLin Wen; ChunHsi Li; MuDer Jeng (SMC, 2005)

Diagnosability Enhancement of Discrete Event Systems. - YuanLin Wen; ChunHsi Li; MuDer Jeng (SMC, 2006)

Automatic Die Inspection for Post-sawing LED Wafers. - Chuan-Yu Chang; Yung-Chi Chang; ChunHsi Li; MuDer Jeng (SMC, 2009)

An unsupervised neural network approach for automatic semiconductor wafer defect inspection. - Chuan-Yu Chang; ChunHsi Li; Jia-Wei Chang; MuDer Jeng (Expert Syst. Appl., 2009)

Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection. - Chuan-Yu Chang; ChunHsi Li; Si-Yan Lin; MuDer Jeng (IEEE Trans. Syst. Man Cybern. Part C, 2009)

A case study of applying regional level-set formulation to post-sawing LED wafer inspection. - ChunHsi Li; Chuan-Yu Chang; MuDer Jeng; Yang-Ting Jeng (SMC, 2010)

Wafer defect inspection by neural analysis of region features. - Chuan-Yu Chang; ChunHsi Li; Yung-Chi Chang; MuDer Jeng (J. Intell. Manuf., 2011)

Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection. - ChunHsi Li; Chuan-Yu Chang; MuDer Jeng (IEEE Trans. Syst. Man Cybern. Part C, 2011)