A novel adaptive map-matching algorithm in vehicular navigation system. - Fang Liu 021; Shoulin Zhu; Chunhua Qi; Jinjun Tang (FSKD, 2010)

Simulation of Liquid Film Flowing Outside the Elliptical Tube. - Chunhua Qi; Houjun Feng; Qingchun Lv; Ke Xu (ICICA (2), 2013)

Novel technique for P-hit single-event transient mitigation using enhance dummy transistor. - Tianqi Wang; Liyi Xiao; Mingxue Huo; Chunhua Qi; Shanshan Liu 001 (ISQED, 2015)

Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology. - Chunhua Qi; Liyi Xiao; Jing Guo 004; Tianqi Wang (Microelectron. Reliab., 2015)

Low-cost resilient radiation hardened flip-flop design. - Liyi Xiao; Chunhua Qi; Tianqi Wang; Hongchen Li; Jiaqiang Li (ASICON, 2017)

A 13T radiation-hardened memory cell for low-voltage operation and ultra-low power space applications. - Chunhua Qi; Liyi Xiao; Mingxue Huo; Tianqi Wang; Rongsheng Zhang; Xuebing Cao (ISQED, 2017)

A fast fault injection platform of multiple SEUs for SRAM-based FPGAs. - Rongsheng Zhang; Liyi Xiao; Jie Li 030; Xuebing Cao; Chunhua Qi; Jiaqiang Li; Mingjiang Wang (Microelectron. Reliab., 2018)

Design of Area-Efficient and Highly Reliable RHBD 10T Memory Cell for Aerospace Applications. - Jing Guo 004; Lei Zhu 004; Yu Sun; Huiliang Cao; Hai Huang; Tianqi Wang; Chunhua Qi; Rongsheng Zhang; Xuebing Cao; Liyi Xiao; Zhigang Mao (IEEE Trans. Very Large Scale Integr. Syst., 2018)

Single-event upset prediction in static random access memory cell account for parameter variations. - Mingxue Huo; Guoliang Ma; Bin Zhou; Liyi Xiao; Chunhua Qi; Yanqing Zhang 012; Jianning Ma; Yinghun Piao; Tianqi Wang (Sci. China Inf. Sci., 2019)

Self-Recovery Tolerance Latch Design Based on the Radiation Mechanism. - Qiang Li; Xiaohui Su; Jing Guo 004; Chunhua Qi (IEEE Access, 2020)

Design of a high-performance 12T SRAM cell for single event upset tolerance. - Chunhua Qi; Yanqing Zhang 012; Guoliang Ma; Chaoming Liu; Tianqi Wang; Liyi Xiao; Mingxue Huo; Guofu Zhai (Sci. China Inf. Sci., 2021)

High-Performance CMOS Latch Designs for Recovering All Single and Double Node Upsets. - Jing Guo 004; Shanshan Liu 001; Xiaohui Su; Chunhua Qi; Fabrizio Lombardi (IEEE Trans. Aerosp. Electron. Syst., 2021)

Design of High-Reliability Memory Cell to Mitigate Single Event Multiple Node Upsets. - Hongchen Li; Liyi Xiao; Chunhua Qi; Jie Li 030 (IEEE Trans. Circuits Syst. I Regul. Pap., 2021)

The Visual Scanning Behavior and Mental Workload of Drivers at Prairie Highway Intersections With Different Characteristics. - Zhen Lyu; Chunhua Qi; Shoulin Zhu; Haixiao Wang (IEEE Access, 2022)