Statistical Inference of Accelerated Life Testing With Dependent Competing Failures Based on Copula Theory. - Xiang Po Zhang; Jianzhong Shang; Xun Chen; Chunhua Zhang 005; Ya Shun Wang (IEEE Trans. Reliab., 2014)

Accelerated reliability demonstration under competing failure modes. - Wei Luo; Chunhua Zhang 005; Xun Chen; Yuan-yuan Tan (Reliab. Eng. Syst. Saf., 2015)

Reliability demonstration methodology for products with Gamma Process by optimal accelerated degradation testing. - Chunhua Zhang 005; Xiang Lu; Yuan-yuan Tan; Ya Shun Wang (Reliab. Eng. Syst. Saf., 2015)