Crack-guided effect on dynamic mechanical stress for foldable low temperature polycrystalline silicon thin film transistors. - Sang Myung Lee; Chuntaek Park; Ilgu Yun (Microelectron. Reliab., 2016)

Mechanical stress-induced degradation model of amorphous InGaZnO thin film transistors by strain-initiated defect generation. - Chuntaek Park; Ilgu Yun (Microelectron. Reliab., 2017)

Compact Drain Current Model of Nanoscale FinFET Considering Short Channel Effect in Ballistic Transport Regime. - Min Soo Bae; Chuntaek Park; Ilgu Yun (SMACD, 2018)