Comparison of electrical stress-induced charge carrier generation/trapping and related degradation of SiO2 and HfO2/SiO2 gate dielectric stacks. - Piyas Samanta; Chunxiang Zhu; Mansun Chan (Microelectron. Reliab., 2010)

State of Health Estimation of Lithium-Ion Battery Using Time Convolution Memory Neural Network. - Chunxiang Zhu; Bowen Zheng; Zhiwei He 001; Mingyu Gao 002; Changcheng Sun; Zhengyi Bao (Mob. Inf. Syst., 2021)

A nanosecond-scale CuI synaptic memristor prepared by a solution-based process. - Bochang Li; Wei Wei; Li Luo; Ming Gao; Chunxiang Zhu (Microelectron. J., 2024)

Reconfigurable Stateful Logic Circuit With Cu/CuI/Pt Memristors for In-Memory Computing. - Li Luo; Bochang Li; Lidan Wang 001; Jinpei Tan; Shukai Duan 001; Chunxiang Zhu (IEEE Trans. Very Large Scale Integr. Syst., 2024)