Impact of stress on various circuit characteristics in 65nm PDSOI technology. - Sushant Suryagandh; Mayank Gupta; Zhiyuan Wu; Srinath Krishnan; Mario Pelella; Jung-Suk Goo; Ciby Thuruthiyil; Judy X. An; Brian Q. Chen; Niraj Subba; Luis Zamudio; James Yonemura; et al. (ESSCIRC, 2007)

Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables. - Bo Yu; Xin Li; James Yonemura; Zhiyuan Wu; Jung-Suk Goo; Ciby Thuruthiyil; Ali Icel (CICC, 2012)