A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing. - Mohamed M. Hafed; Antonio H. Chan; Geoffrey D. Duerden; Bardia Pishdad; Clarence Tam; Sébastien Laberge; Gordon W. Roberts (ITC, 2004)

Massively Parallel Validation of High-Speed Serial Interfaces using Compact Instrument Modules. - Mohamed Hafed; Daniel Watkins; Clarence Tam; Bardia Pishdad (ITC, 2006)

Modeling Epidemic Spreading through Public Transit using Time-Varying Encounter Network. - Baichuan Mo; Kairui Feng; Yu Shen; Clarence Tam; Daqing Li; Yafeng Yin; Jinhua Zhao (CoRR, 2020)