A non-iterative physical procedure for RF CMOS compact model extraction using BSIM6. - Sriramkumar Venugopalan; Krishnanshu Dandu; Samuel Martin; Richard Taylor; Claude Cirba; Xin Zhang; Ali M. Niknejad; Chenming Hu (CICC, 2012)

Recovery modeling of negative bias temperature instability (NBTI) for SPICE-compatible circuit aging simulators. - Haldun Küflüoglu; Cathy Chancellor; Min Chen 024; Claude Cirba; Vijay Reddy (ACM J. Emerg. Technol. Comput. Syst., 2014)