Applicative System Level Test introduction to Increase Confidence on Screening Quality. - Paolo Bernardi; Marco Restifo; Matteo Sonza Reorda; Davide Appello; Claudia Bertani; D. Petrali (DDECS, 2020)

Innovative methods for Burn-In related Stress Metrics Computation. - Walter Ruggeri; Paolo Bernardi; Stefano Littardi; Matteo Sonza Reorda; Davide Appello; Claudia Bertani; Giorgio Pollaccia; Vincenzo Tancorre; Roberto Ugioli (DTIS, 2021)

Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. - Paolo Bernardi; Gabriele Filipponi; Matteo Sonza Reorda; Davide Appello; Claudia Bertani; Vincenzo Tancorre (DDECS, 2023)

A guided debugger-based fault injection methodology for assessing functional test programs. - Francesco Angione; Paolo Bernardi; Nicola Di Gruttola Giardino; Davide Appello; Claudia Bertani; Vincenzo Tancorre (VTS, 2023)

A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. - Francesco Angione; Davide Appello; Paolo Bernardi; Claudia Bertani; Giovambattista Gallo; Stefano Littardi; Giorgio Pollaccia; Walter Ruggeri; Matteo Sonza Reorda; Vincenzo Tancorre; Roberto Ugioli (IEEE Trans. Computers, 2023)

A Flexible FPGA-Based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems. - Nicola Di Gruttola Giardino; Francesco Angione; Paolo Bernardi; Tommaso Foscale; Claudia Bertani; Vincenzo Tancorre (DFT, 2024)

Leveraging ATE to Optimize System-Level-Test for Multicore Automotive SoCs. - Francesco Angione; Paolo Bernardi; Claudia Bertani; Lorenzo Bertetto; Lorenzo Cardone; Nicola Di Gruttola Giardino; Stefano Quer; Vincenzo Tancorre (LATS, 2025)

Enhancing Logic Diagnosis of Field Returns Through Logic BIST in Automotive SoCs. - Paolo Bernardi; Gabriele Filipponi; Giusy Iaria; Claudia Bertani; Vincenzo Tancorre (LATS, 2025)

A System-Level Test Methodology for Communication Peripherals in System-on-Chips. - Francesco Angione; Paolo Bernardi; Nicola Di Gruttola Giardino; Gabriele Filipponi; Claudia Bertani; Vincenzo Tancorre (IEEE Trans. Computers, 2025)

A Comprehensive Scan Test Cost Model to Optimize the Production of Very Large SoCs. - Giusy Iaria; Paolo Bernardi; Claudia Bertani; Lorenzo Cardone; Giuseppe Garozzo; Vincenzo Tancorre (IEEE Trans. Computers, 2025)

Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC. - Francesco Angione; Paolo Bernardi; Giusy Iaria; Claudia Bertani; Vincenzo Tancorre (IEEE Trans. Computers, 2025)