Measurement of the local latch-up sensitivity by means of computer-controller scanning electron microscopy. - Claudio Canali; Manuela Giannini; Andrea Scorzoni; Massimo Vanzi; Enrico Zanoni (IEEE J. Solid State Circuits, 1988)

VLSI reliability: Contributions from a three year national research program. - Giovanni Soncini; Claudio Canali; Enrico Zanoni; Francrsco Cors; Alessandro Diligenti; Fausto Fantini; Vito A. Monaco; Guido Masetti; Carlo Morandi (Eur. Trans. Telecommun., 1990)

DC-to-RF dispersion effects in GaAs- and GaN-based heterostructure FETs: performance and reliability issues. - Giovanni Verzellesi; Gaudenzio Meneghesso; Alessandro Chini; Enrico Zanoni; Claudio Canali (Microelectron. Reliab., 2005)