Simultaneous IC-internal voltage and current measurements via a multi lever Scanning Force Microscope. - Claus Hartmann; Rainer Weber; Wolfgang Mertin; Erich Kubalek; Anne-Dorothea Müller; Michael Hietschold (Microelectron. Reliab., 2002)

Circuit-internal signal measurements with a needle sensor. - Claus Hartmann; Wolfgang Mertin; Gerd Bacher (Microelectron. Reliab., 2005)

Layout analysis as supporting tool for failure localization: Basic principles and case studies. - Claus Hartmann; M. Wieberneit (Microelectron. Reliab., 2008)

Investigation on marginal failure characteristics and related defects analysed by soft defect localization. - Claus Hartmann; M. Wieberneit (Microelectron. Reliab., 2009)

Investigation on BIST assisted failure analysis on digital integrated circuits. - Claus Hartmann; M. Wieberneit (Microelectron. Reliab., 2010)