A structured and scalable mechanism for test access to embedded reusable cores. - Erik Jan Marinissen; Robert G. J. Arendsen; Gerard Bos; Hans Dingemanse; Maurice Lousberg; Clemens Wouters (ITC, 1998)

Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach. - Chris Feige; Jan Ten Pierick; Clemens Wouters; Ronald J. W. T. Tangelder; Hans G. Kerkhoff (J. Electron. Test., 1999)

A P1500 Compliant Programable BistShell for Embedded Memories. - Sandeep Koranne; Tom Waayers; Robert Beurze; Clemens Wouters; Sunil Kumar; G. S. Visweswara (MTDT, 2001)

Yield analysis for repairable embedded memories. - Anuja Sehgal; Aishwarya Dubey; Erik Jan Marinissen; Clemens Wouters; Harald P. E. Vranken; Krishnendu Chakrabarty (ETW, 2003)

Test quality analysis and improvement for an embedded asynchronous FIFO. - Tobias Dubois; Erik Jan Marinissen; Mohamed Azimane; Paul Wielage; Erik Larsson; Clemens Wouters (DATE, 2007)

Design and DfT of a high-speed area-efficient embedded asynchronous FIFO. - Paul Wielage; Erik Jan Marinissen; Michel Altheimer; Clemens Wouters (DATE, 2007)