On the use of synthetic images in deep learning for defect recognition in industrial infrastructures. - Clement Mailhe; Amine Ammar; Francisco Chinesta (ICMVA, 2023)

Towards improving synthetic-to-real image correlation for instance recognition in structure monitoring. - Clement Mailhe; Amine Ammar; Francisco Chinesta; Dominique Baillargeat (Vis. Comput., 2025)