Soft-defect detection (SDD) technique for a high-reliability CMOS SRAM. - Clinton Kuo; Thomas Toms; Bruce T. Neel; Joe Jelemensky; Ernest A. Carter; Philip Smith (IEEE J. Solid State Circuits, 1990)

A 512-kb flash EEPROM embedded in a 32-b microcontroller. - Clinton Kuo; Mark Weidner; Thomas Toms; Henry Choe; Ko-Min Chang; Ann Hanvood; Joseph Jelemensky; Philip Smith (IEEE J. Solid State Circuits, 1992)