Low temperature endurance failures on flash memory. - Stephen K. Heinrich-Barna; Clyde Dunn; Doug Verret (ISQED, 2017)

Program Disturb Mechanism in Embedded SuperFlash® Technology. - Clyde Dunn; John MacPeak; Sean Bo; Brian Kirkpatrick; Brian Horning; Tad Grider; Corey O'Brien; Steve Heinrich-Barna; Armando Vigil; Jon Nafziger; Lyndon Preiss; Kelly DeShields; et al. (IRPS, 2020)