Dynamic Input Match Correction in RF Low Noise Amplifiers. - Tejasvi Das; Anand Gopalan; Clyde Washburn; P. R. Mukund (DFT, 2004)

Accurate performance prediction of multi-GHz CML with data run-length variations. - Sripriya R. Bandi; Clyde Washburn; P. R. Mukund; Jan Kolnik; Minxuan Liu; Ken Paradis; Steve Howard; Jeff Burleson (ISCAS (5), 2005)

Use of source degeneration for non-intrusive BIST of RF front-end circuits. - Anand Gopalan; Tejasvi Das; Clyde Washburn; Ponnathpur R. Mukund (ISCAS (5), 2005)

Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs. - Tejasvi Das; Clyde Washburn; P. R. Mukund; Steve Howard; Ken Paradis; Jung-Geau Jang; Jan Kolnik; Jeff Burleson (VLSI Design, 2005)

An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers. - Anand Gopalan; Tejasvi Das; Clyde Washburn; P. R. Mukund (VLSI Design, 2005)

System in a Package Design of a RF Front End System Using Application Specific Reduced Order Models. - Ghanshyam Nayak; Clyde Washburn; P. R. Mukund (VLSI Design, 2005)

Self-calibration of input-match in RF front-end circuitry. - Tejasvi Das; Anand Gopalan; Clyde Washburn; Ponnathpur R. Mukund (IEEE Trans. Circuits Syst. II Express Briefs, 2005)

An analytical propagation delay model with power supply noise effects. - Mark Pude; Clyde Washburn; Ponnathpur R. Mukund; Kouichi Abe; Yoshinori Nishi (ISCAS, 2006)

A universal common-source and common-drain model for 1-20GHz frequency range. - S. Sridharan; Sripriya R. Bandi; Clyde Washburn; Ponnathpur R. Mukund; Jan Kolnik; Ken Paradis; Steve Howard; Jeff Burleson (ISCAS, 2006)

Towards Fault-Tolerant RF Front Ends. - Tejasvi Das; Anand Gopalan; Clyde Washburn; P. R. Mukund (J. Electron. Test., 2006)

Analog IC Design in Ultra-Thin Oxide CMOS Technologies With Significant Direct Tunneling-Induced Gate Current. - Eric Bohannon; Clyde Washburn; Ponnathpur R. Mukund (IEEE Trans. Circuits Syst. I Regul. Pap., 2011)

An ultra-thin oxide sub-1 V CMOS bandgap voltage reference. - Eric Bohannon; Clyde Washburn; P. R. Mukund (Int. J. Circuit Theory Appl., 2014)