Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. - B. Khong; Patrick Tounsi; Philippe Dupuy; X. Chauffleur; Marc Legros; A. Deram; Colette Levade; G. Vanderschaeve; Jean-Marie Dorkel; Jean-Pierre Fradin (Microelectron. Reliab., 2005)

Characterization and modelling of ageing failures on power MOSFET devices. - B. Khong; Marc Legros; Patrick Tounsi; Philippe Dupuy; X. Chauffleur; Colette Levade; G. Vanderschaeve; Emmanuel Scheid (Microelectron. Reliab., 2007)

Characterization of ageing failures on power MOSFET devices by electron and ion microscopies. - Donatien Martineau; Thomas Mazeaud; Marc Legros; Philippe Dupuy; Colette Levade; G. Vanderschaeve (Microelectron. Reliab., 2009)

Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue. - Donatien Martineau; Thomas Mazeaud; Marc Legros; Philippe Dupuy; Colette Levade (Microelectron. Reliab., 2010)

Universal mechanisms of Al metallization ageing in power MOSFET devices. - Donatien Martineau; Colette Levade; Marc Legros; Philippe Dupuy; Thomas Mazeaud (Microelectron. Reliab., 2014)