HITEST Test Generation System Interfaces. - Colin M. Maunder (ITC, 1983)

Digital logic testing and simulation: Alexander Miczo Harper and Row, Plymouth, UK (1986) £24.95 pp 141. - Colin Maunder (Microprocess. Microsystems, 1986)

Bargain for testability researchers: Tsui, F FLSI/VLSI testability design McGrawHill, New York, NY, USA (1987) £49.95 pp 702. - Colin Maunder (Microprocess. Microsystems, 1987)

Built-in test for VLSI - pseudorandom techniques: Bardell, P H, McArney, W H and Savir, J Wiley, New York, NY, USA (1987) £45.00 pp 354. - Colin Maunder (Microprocess. Microsystems, 1989)

Languages to Support Boundary-Scan Test. - Colin M. Maunder (ITC, 1991)

An introduction to the boundary scan standard: ANSI/IEEE Std 1149.1. - Colin M. Maunder; Rodham E. Tulloss (J. Electron. Test., 1991)

A D&T Special Report-Boundary Scan: An End-of-Term Report-IEEE Std 1149.1 Survey Results. - Colin M. Maunder (IEEE Des. Test Comput., 1992)

A Universal Framework for Managed Built-in Test. - Colin M. Maunder (ITC, 1993)

Position Statement: ITC93 Boundary-Scan Panel. - Colin M. Maunder (ITC, 1993)

Boundary-scan testing. - Colin Maunder (Microprocess. Microsystems, 1993)

Testability on TAP. - Colin M. Maunder; Rodham E. Tulloss (Microprocess. Microsystems, 1993)

Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution. - Alfred L. Crouch; Rick Ramus; Colin M. Maunder (ITC, 1994)

Plug and Play or Plug and Pray: We Have a Right to Know It Will Work (Or Why It Won't). - Colin M. Maunder (ITC, 1997)

The Future: Plug and Pray? - Colin M. Maunder (IEEE Des. Test Comput., 1998)

Test: shared problems and shared solutions. - Colin Maunder (IEEE Commun. Mag., 1999)