HCD-Induced GIDL Increase and Circuit Implications. - Edoardo Ceccarelli; Kevin Manning; Giuseppe Macera; Dennis Dempsey; Colm Heffernan (IOLTS, 2019)

GIDL Increase Due to HCI Stress: Correlation Study of MOSFET Degradation Parameters and Modelling for Reliability Simulation. - Edoardo Ceccarelli; Kevin Manning; Seamus Maxwell; Colm Heffernan (IRPS, 2019)