New simulation methodology for effects of radiation in semiconductor chip structures. - Henry H. K. Tang; Conal E. Murray; Giovanni Fiorenza; Kenneth P. Rodbell; Michael S. Gordon; David F. Heidel (IBM J. Res. Dev., 2008)

SOI FinFET soft error upset susceptibility and analysis. - Phil Oldiges; Kenneth P. Rodbell; Michael S. Gordon; John G. Massey; Kevin Stawiasz; Conal E. Murray; Henry H. K. Tang; K. Kim; K. Paul Muller (IRPS, 2015)