Efficient generation of pre-silicon MOS model parameters for early circuit design. - Michael Orshansky; Judy An; Chun Jiang; Bill Liu; Concetta Riccobene; Chenming Hu (IEEE J. Solid State Circuits, 2001)

Innovative practices session 2C: Memory test. - Charutosh Dixit; Ramesh C. Tekumalla; Sreejit Chakravarty; Manuel d'Abreu; Zhuoyu Bao; Concetta Riccobene (VTS, 2013)