An Optimized Test During Burn-In for Automotive SoC. - Davide Appello; Conrad Bugeja; Giorgio Pollaccia; Paolo Bernardi; Riccardo Cantoro; Marco Restifo; Ernesto Sánchez 001; Federico Venini (IEEE Des. Test, 2018)

Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. - Davide Appello; Paolo Bernardi; Conrad Bugeja; Riccardo Cantoro; Giorgio Pollaccia; Marco Restifo; Federico Venini (J. Electron. Test., 2018)

An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. - Davide Appello; Paolo Bernardi; Conrad Bugeja; Riccardo Cantoro; Andrea Colazzo; Alessandro Motta; Alberto Pagani; Giorgio Pollaccia; Marco Restifo; Ernesto Sánchez 001; Federico Venini (J. Low Power Electron., 2018)