Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits. - Miquel Vellvehí; Xavier Perpiñà; Javier Leon; Oriol Avino-Salvado; Conrad Ferrer; Xavier Jordà (IEEE Trans. Ind. Electron., 2021)

Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics. - Conrad Ferrer; Oriol Avino-Salvado; Miquel Vellvehí; Xavier Jordà; Xavier Perpiñà (IEEE Trans. Instrum. Meas., 2023)

Measurement Uncertainty in Fourier Coefficient- Based Time Series Reconstruction Considering Calibration Effects in Thermal Imaging. - Roger Solé; Conrad Ferrer; Oriol Avino-Salvado; Xavier Jordà; Xavier Perpiñà (IEEE Trans. Instrum. Meas., 2024)