Test pattern generation for multiple stuck-at faults not covered by test patterns for single faults. - Conrad J. Moore; Peikun Wang; Amir Masoud Gharehbaghi; Masahiro Fujita (ISCAS, 2017)

An ATPG Method for Double Stuck-At Faults by Analyzing Propagation Paths of Single Faults. - Peikun Wang; Conrad J. Moore; Amir Masoud Gharehbaghi; Masahiro Fujita (IEEE Trans. Circuits Syst. I Regul. Pap., 2018)