IC laser trimming speed-up through wafer-level spatial correlation modeling. - Constantinos Xanthopoulos; Ke Huang 001; Abbas Poonawala; Amit Nahar; Bob Orr; John M. Carulli Jr.; Yiorgos Makris (ITC, 2014)

Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models. - Ke Huang 001; Nathan Kupp; Constantinos Xanthopoulos; John M. Carulli Jr.; Yiorgos Makris (IEEE Des. Test, 2015)

Harnessing process variations for optimizing wafer-level probe-test flow. - Ali Ahmadi; Constantinos Xanthopoulos; Amit Nahar; Bob Orr; Michael Pas; Yiorgos Makris (ITC, 2016)

Wafer-level adaptive trim seed forecasting based on E-tests. - Constantinos Xanthopoulos; Ali Ahmadi; Sirish Boddikurapati; Amit Nahar; Bob Orr; Yiorgos Makris (ISCAS, 2017)

Automated die inking: A pattern recognition-based approach. - Constantinos Xanthopoulos; Peter Sarson; Heinz Reiter; Yiorgos Makris (ITC, 2017)

Enhanced hotspot detection through synthetic pattern generation and design of experiments. - Gaurav Rajavendra Reddy; Constantinos Xanthopoulos; Yiorgos Makris (VTS, 2018)

Wafer-Level Adaptive Vmin Calibration Seed Forecasting. - Constantinos Xanthopoulos; Deepika Neethirajan; Sirish Boddikurapati; Amit Nahar; Yiorgos Makris (DATE, 2019)

Automated Die Inking through On-line Machine Learning. - Constantinos Xanthopoulos; Arnold Neckermann; Paulus List; Klaus-Peter Tschernay; Peter Sarson; Yiorgos Makris (IOLTS, 2019)

Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion. - Kosuke Ikeda; Keith Schaub; Ira Leventhal; Yiorgos Makris; Constantinos Xanthopoulos; Deepika Neethirajan (ITC, 2019)

Machine Learning-based Noise Classification and Decomposition in RF Transceivers. - Deepika Neethirajan; Constantinos Xanthopoulos; Kiruba S. Subramani; Keith Schaub; Ira Leventhal; Yiorgos Makris (VTS, 2019)

Automated Socket Anomaly Detection through Deep Learning. - Nidhi Agrawal; Min-Jian Yang; Constantinos Xanthopoulos; Vijayakumar Thangamariappan; Joe Xiao; Chee-Wah Ho; Keith Schaub; Ira Leventhal (ITC, 2020)

Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation. - V. A. Niranjan; Deepika Neethirajan; Constantinos Xanthopoulos; E. De La Rosa; C. Alleyne; S. Mier; Yiorgos Makris (VTS, 2021)

On Improving Hotspot Detection Through Synthetic Pattern-Based Database Enhancement. - Gaurav Rajavendra Reddy; Constantinos Xanthopoulos; Yiorgos Makris (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)

Zero Trust Approach to IC Manufacturing and Testing. - Brian Buras; Constantinos Xanthopoulos; Ken Butler; Jason Kim 008 (ITC, 2022)

Improvements in Automated IC Socket Pin Defect Detection. - Vijayakumar Thangamariappan; Nidhi Agrawal; Jason Kim 008; Constantinos Xanthopoulos; Ken Butler; Ira Leventhal; Joe Xiao (ITC, 2022)

Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing. - V. A. Niranjan; Deepika Neethirajan; Constantinos Xanthopoulos; D. Webster; Amit Nahar; Yiorgos Makris (VTS, 2023)