Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling. - H. V. Nguyen; Cora Salm; J. Vroemen; J. Voets; Benno Krabbenborg; Jaap Bisschop; A. J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2002)

Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime. - H. V. Nguyen; Cora Salm; R. Wenzel; A. J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2002)

The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress. - M. S. B. Sowariraj; Theo Smedes; Cora Salm; Ton J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2002)

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. - M. S. B. Sowariraj; Theo Smedes; Cora Salm; Ton J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2003)

Plasma Charging Damage Reduction in IC Processing by A Self-balancing Interconnect. - Zhichun Wang; Jan Ackaert; Cora Salm; Fred G. Kuper; Eddy De Backer (Microelectron. Reliab., 2004)

A 3-D Circuit Model to evaluate CDM performance of ICs. - M. S. B. Sowariraj; Theo Smedes; Peter C. de Jong; Cora Salm; Ton J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2005)

Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. - Cora Salm; André J. Hof; Fred G. Kuper; Jurriaan Schmitz (Microelectron. Reliab., 2006)

Low-Frequency Noise Phenomena in Switched MOSFETs. - Arnoud P. van der Wel; Eric A. M. Klumperink; Jay S. Kolhatkar; Eric Hoekstra; Martijn F. Snoeij; Cora Salm; Hans Wallinga; Bram Nauta (IEEE J. Solid State Circuits, 2007)

Low-frequency noise in hot-carrier degraded nMOSFETs. - Cora Salm; Eric Hoekstra; Jay S. Kolhatkar; André J. Hof; Hans Wallinga; Jurriaan Schmitz (Microelectron. Reliab., 2007)

Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip. - Cora Salm; Victor M. Blanco Carballo; Joost Melai; Jurriaan Schmitz (Microelectron. Reliab., 2008)

Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs. - Maurits J. de Jong; Cora Salm; Jurriaan Schmitz (Microelectron. Reliab., 2017)

Towards understanding recovery of hot-carrier induced degradation. - Maurits J. de Jong; Cora Salm; Jurriaan Schmitz (Microelectron. Reliab., 2018)

Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. - Maurits J. de Jong; Cora Salm; Jurriaan Schmitz (IRPS, 2020)